Patent Assignment
Reel/Frame 031560/0713
Assignment of Assignor's Interest
Recorded: 2013-11-07
Pages: 3
Assignor
MIKI, KOUJI
Executed: 2013-10-15
Assignee
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Property
(1)
Scan Circuit, Semiconductor Device, and Method for Testing Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.