Patent Assignment
Reel/Frame 031626/0564
Assignment of Assignor's Interest
Recorded: 2013-11-12
Pages: 2
Assignor
KIM, KYOUNG BEOM
Executed: 2013-10-11
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Chip Tester and Test Method of Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.