IP Library › Assignment 031641/0734
Patent Assignment
Reel/Frame 031641/0734

Assignment of Assignor's Interest

Recorded: 2013-11-20 Pages: 3
Assignors
LI, WEN
Executed: 2013-09-02
IMURA, HISAFUMI
Executed: 2013-08-29
KAWANO, HAJIME
Executed: 2013-09-02
TAKAHASHI, HIROYUKI
Executed: 2013-09-02
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Measuring/Inspecting Apparatus and Measuring/Inspecting Method Enabling Blanking Control of Electron Beam
Patent: 8,890,096 →
Application: 13/935,853 →
Publication: US 2014/0008534
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →