IP Library › Assignment 031649/0657
Patent Assignment
Reel/Frame 031649/0657

Assignment of Assignor's Interest

Recorded: 2013-11-21 Pages: 2
Assignor
TAKAGI, YUJI
Executed: 2013-11-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device Defect Inspection Method and System Thereof
Patent: 9,153,020 →
Application: 14/119,138 →
Publication: US 2014/0198974
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →