IP Library › Assignment 031671/0468
Patent Assignment
Reel/Frame 031671/0468

Assignment of Assignor's Interest

Recorded: 2013-11-25 Pages: 3
Assignors
MINEKAWA, YOHEI
Executed: 2013-10-21
TAKAGI, YUJI
Executed: 2013-10-22
HARADA, MINORU
Executed: 2013-11-05
HIRAI, TAKEHIRO
Executed: 2013-10-28
NAKAGAKI, RYO
Executed: 2013-10-22
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Classification Method, and Defect Classification System
Patent: 9,401,015 →
Application: 14/112,105 →
Publication: US 2014/0072204
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →