IP Library › Assignment 031716/0148
Patent Assignment
Reel/Frame 031716/0148

Assignment of Assignor's Interest

Recorded: 2013-12-04 Pages: 3
Assignors
TSUNO, NATSUKI
Executed: 2013-11-18
KAZUMI, HIDEYUKI
Executed: 2013-11-19
MOCHIZUKI, YUZURU
Executed: 2013-11-19
MIWA, TAKAFUMI
Executed: 2013-11-19
KIMURA, YOSHINOBU
Executed: 2013-11-19
YOKOSUKA, TOSHIYUKI
Executed: 2013-11-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electron Microscope and Image Capturing Method Using Electron Beam
Patent: 8,907,279 →
Application: 14/123,744 →
Publication: US 2014/0097342
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →