Patent Assignment
Reel/Frame 031870/0879
Assignment of Assignor's Interest
Recorded: 2014-01-04
Pages: 4
Assignee
TOYOTA JIDOSHA KABUSHIKI KAISHA
1, TOYOTA-CHO, TOYOTA-SHI, AICHI-KEN, 471-8571, JAPAN
Covered Property
(1)
Wafer Examination Device and Wafer Examiination Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.