IP Library Assignment 032039/0085
Patent Assignment
Reel/Frame 032039/0085

Assignment of Assignor's Interest

Recorded: 2014-01-24 Pages: 8
Assignors
CALDWELL, BRIAN N.
Executed: 2014-01-13
JEFFER, RAYMOND W.
Executed: 2014-01-08
LEVIN, JAMES P.
Executed: 2014-01-15
MALENFANT, JOSEPH L., JR.
Executed: 2014-01-08
NASH, STEVEN C.
Executed: 2014-01-08
Assignee
INTERNATIONAL BUSINESS MACHINES CORPORATION
NEW ORCHARD ROAD, ARMONK, NEW YORK, 10504
Covered Property (1)
Test Pattern Layout for Test Photomask and Method for Evaluating Critical Dimension Changes
Patent: 9,372,394 →
Application: 14/162,894 →
Publication: US 2015/0212405
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 24, 2014
From: FUJITA, YUKI
To: TOPPAN PRINTING CO., LTD.
Reel/Frame 032183/0001 →