Assignment of Assignor's Interest

Recorded: 2014-01-24 Pages: 3

Assignor

FUJITA, YUKI

Executed: 2014-01-23

Assignee

TOPPAN PRINTING CO., LTD.

1-51- TAITO, TAITO-KU, TOKYO, 110-8560, JAPAN

Covered Property (1)

Test Pattern Layout for Test Photomask and Method for Evaluating Critical Dimension Changes

Patent: 9,372,394 →

Application: 14/162,894 →

Publication: US 2015/0212405

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.