IP Library › Assignment 032201/0663
Patent Assignment
Reel/Frame 032201/0663

Assignment of Assignor's Interest

Recorded: 2014-02-12 Pages: 2
Assignors
SHIBAHARA, TAKUMA
Executed: 2013-12-10
OIKAWA, MICHIO
Executed: 2014-01-14
HOJO, YUTAKA
Executed: 2013-12-17
SUGAHARA, HITOSHI
Executed: 2013-12-16
SHINDO, HIROYUKI
Executed: 2013-12-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measurement Device and Pattern Measurement Method
Patent: 8,959,461 →
Application: 14/233,003 →
Publication: US 2014/0224986
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →