IP Library › Assignment 032482/0556
Patent Assignment
Reel/Frame 032482/0556

Assignment of Assignor's Interest

Recorded: 2014-03-13 Pages: 3
Assignors
MAN, XIN
Executed: 2013-09-11
FUJII, TOSHIAKI
Executed: 2013-09-11
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Crystal Analysis Apparatus, Composite Charged Particle Beam Device, and Crystal Analysis Method
Patent: 9,046,472 →
Application: 14/025,985 →
Publication: US 2014/0077097
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 13, 2014
From: MAN, XIN; FUJII, TOSHIAKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 032482/0683 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →