IP Library › Assignment 032514/0083
Patent Assignment
Reel/Frame 032514/0083

Assignment of Assignor's Interest

Recorded: 2014-03-25 Pages: 4
Assignors
UEMOTO, ATSUSHI
Executed: 2014-03-14
MAN, XIN
Executed: 2014-03-14
ASAHATA, TATSUYA
Executed: 2014-03-14
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Focused Ion Beam Apparatus, Method for Observing Cross-Section of Sample by Using the Same, and Storage Medium
Patent: 9,934,938 →
Application: 14/224,164 →
Publication: US 2014/0291508
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →