IP Library › Assignment 032772/0996
Patent Assignment
Reel/Frame 032772/0996

Assignment of Assignor's Interest

Recorded: 2014-04-28 Pages: 3
Assignors
MIWA, TAKAFUMI
Executed: 2014-03-31
OSE, YOICHI
Executed: 2014-04-01
NAKAZAWA, EIKO
Executed: 2014-04-02
KONOMI, MAMI
Executed: 2014-04-09
WATANABE, SHUNYA
Executed: 2014-04-09
KIMURA, YOSHINOBU
Executed: 2014-03-31
TSUNO, NATSUKI
Executed: 2014-03-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Observation Specimen for Use in Electron Microscopy, Electron Microscopy, Electron Microscope, and Device for Producing Observation Specimen
Patent: 9,202,668 →
Application: 14/354,917 →
Publication: US 2014/0264018
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →