Patent Assignment
Reel/Frame 032918/0729
Assignment of Assignor's Interest
Recorded: 2014-03-21
Pages: 4
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property
(1)
Focused Ion Beam Apparatus and Method of Working Sample Using the Same
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.