Assignment of Assignor's Interest

Recorded: 2014-06-20 Pages: 3

Assignors

JENSEN, EARL

Executed: 2014-06-19

O'BRIEN, KEVIN

Executed: 2014-06-19

Assignee

KLA-TENCOR CORPORATION

1 TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035

Covered Properties (2)

Thickness Change Monitor Wafer for in Situ Film Thickness Monitoring

Patent: 9,305,753 →

Application: 14/195,390 →

Publication: US 2014/0253928

Thickness Change Monitor Wafer for In Situ Film Thickness Monitoring

Application: 61/773,318 →