Assignment of Assignor's Interest

Recorded: 2014-06-25 Pages: 3

Assignors

IDO, NORIYASU

Executed: 2014-04-23

INADA, KOUJI

Executed: 2014-04-23

WATANABE, KAZUHIRO

Executed: 2014-04-23

Assignee

SEN CORPORATION

1-1 OSAKI 2-CHOME, SHINAGAWA-KU, TOKYO, 141-6025, JAPAN

Covered Property (1)

Ion Beam Measuring Device and Method of Measuring Ion Beam

Patent: 9,564,292 →

Application: 14/314,448 →

Publication: US 2015/0001418

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.