IP Library › Assignment 033308/0610
Patent Assignment
Reel/Frame 033308/0610

Assignment of Assignor's Interest

Recorded: 2014-07-14 Pages: 2
Assignors
HARADA, MINORU
Executed: 2014-04-16
NAKAGAKI, RYO
Executed: 2014-04-16
FUKUNAGA, FUMIHIKO
Executed: 2014-04-18
TAKAGI, YUJI
Executed: 2014-04-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Measuring Overlay and Measuring Apparatus, Scanning Electron Microscope, and Gui
Patent: 9,799,112 →
Application: 14/370,727 →
Publication: US 2014/0375793
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →