IP Library › Assignment 033316/0381
Patent Assignment
Reel/Frame 033316/0381

Assignment of Assignor's Interest

Recorded: 2014-07-15 Pages: 2
Assignors
URANO, YUTA
Executed: 2014-04-09
UENO, TAKETO
Executed: 2014-04-09
HAMAMATSU, AKIRA
Executed: 2014-04-14
HONDA, TOSHIFUMI
Executed: 2014-04-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Apparatus and Defect Inspection Method
Patent: 9,588,055 →
Application: 14/331,681 →
Publication: US 2015/0062581
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →