Patent Assignment
Reel/Frame 033350/0258
Assignment of Assignor's Interest
Recorded: 2014-07-21
Pages: 3
Assignor
OTSUKA, TAKESHI
Executed: 2014-05-28
Assignee
JEOL LTD.
1-2, MUSASHINO 3-CHOME, AKISHIMA, TOKYO, 196-8558, JAPAN
Covered Property
(1)
Scanning Charged Particle Microscope, Image Acquisition Method, and Electron Detection Method