Patent Assignment
Reel/Frame 033497/0260
Assignment of Assignor's Interest
Recorded: 2014-08-08
Pages: 4
Assignors
KOZAKAI, TOMOKAZU
Executed: 2014-08-08
MATSUDA, OSAMU
Executed: 2014-08-08
SUGIYAMA, YASUHIKO
Executed: 2014-08-08
AITA, KAZUO
Executed: 2014-08-08
ARAMAKI, FUMIO
Executed: 2014-08-08
YASAKA, ANTO
Executed: 2014-08-08
OBA, HIROSHI
Executed: 2014-08-08
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property
(1)
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus