IP Library › Assignment 033550/0605
Patent Assignment
Reel/Frame 033550/0605

Assignment of Assignor's Interest

Recorded: 2014-08-16 Pages: 2
Assignors
TSUNETA, RURIKO
Executed: 2014-07-01
KIKUCHI, HIDEKI
Executed: 2014-07-09
KASHIMA, HIDEO
Executed: 2014-07-03
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
882, ICHIGE, HITACHINAKA-SHI, IBARAKI, 312-0033, JAPAN
Covered Property (1)
Charged Particle Beam Microscope, Sample Holder for Charged Particle Beam Microscope, and Charged Particle Beam Microscopy
Patent: 8,963,102 →
Application: 14/373,359 →
Publication: US 2014/0353500
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →