IP Library › Assignment 033561/0776
Patent Assignment
Reel/Frame 033561/0776

Assignment of Assignor's Interest

Recorded: 2014-08-19 Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2014-07-14
SHIMURA, KEI
Executed: 2014-05-21
UTO, SACHIO
Executed: 2014-05-20
HONDA, TOSHIFUMI
Executed: 2014-06-01
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Its Device
Patent: 9,513,228 →
Application: 14/377,753 →
Publication: US 2015/0022806
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →