Patent Assignment
Reel/Frame 033563/0504
Assignment of Assignor's Interest
Recorded: 2014-08-19
Pages: 8
Assignors
KIM, SUA
Executed: 2014-07-05
KANG, DONGSOO
Executed: 2014-08-05
PARK, CHULWOO
Executed: 2014-07-25
YOO, JUN HEE
Executed: 2014-08-05
YU, HAK-SOO
Executed: 2014-07-25
YOUN, JAEYOUN
Executed: 2014-07-24
LEE, SUNG HYUN
Executed: 2014-07-31
JUNG, JINSU
Executed: 2014-07-24
CHOI, HYOJIN
Executed: 2014-07-24
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Test Method of Semiconductor Memory Device and Semiconductor Memory System Transferring Fail Address Data from a Volatile to a Non-Volatile Memory Array Using an Error-Correction Code Engine