Patent Assignment
Reel/Frame 033575/0324
Assignment of Assignor's Interest
Recorded: 2014-08-20
Pages: 8
Assignors
VAN DER PLAS, GEERT
Executed: 2014-08-01
SAWADA, KEN
Executed: 2014-07-30
MIYAMORI, YUICHI
Executed: 2014-07-29
ANCHLIA, ANKUR
Executed: 2014-07-30
MERCHA, ABDELKARIM
Executed: 2014-07-24
Assignees
IMEC
KAPELDREEF 75, LEUVEN, 3001, BELGIUM
SONY CORPORATION
1-7-1 KONAN, MINATO-KU, TOKYO, 108-0075, JAPAN
Covered Property
(1)
Method and System for Measuring Capacitance Difference Between Capacitive Elements