IP Library Assignment 033629/0716
Patent Assignment
Reel/Frame 033629/0716

Assignment of Assignor's Interest

Recorded: 2014-08-28 Pages: 3
Assignors
IKEJIRI, HIDEO
Executed: 2007-04-27
ONISHI, SHINSUKE
Executed: 2007-04-27
Assignee
OKI ELECTRIC INDUSTRY CO., LTD.
7-12, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-8460, JAPAN
Covered Property (1)
Semiconductor Device with Its Test Time Reduced and a Test Method Therefor
Patent: 7,724,024 →
Application: 12/479,083 →
Publication: US 2009/0251170
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Aug 28, 2014
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 033629/0740 →
Change of Name Aug 29, 2014
From: OKI SEMICONDUCTOR CO., LTD.
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 033639/0817 →