IP Library › Assignment 034028/0717
Patent Assignment
Reel/Frame 034028/0717

Assignment of Assignor's Interest

Recorded: 2014-10-24 Pages: 2
Assignors
HONDA, TOSHIFUMI
Executed: 2014-10-03
URANO, YUTA
Executed: 2014-10-01
JINGU, TAKAHIRO
Executed: 2014-10-06
HAMAMATSU, AKIRA
Executed: 2014-10-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device and Defect Inspection Method
Patent: 9,329,136 →
Application: 14/396,908 →
Publication: US 2015/0146200
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →