Patent Assignment
Reel/Frame 034044/0331
Assignment of Assignor's Interest
Recorded: 2014-10-27
Pages: 6
Assignors
MEIJER, JAN ANDRIES
Executed: 2014-08-13
SCHEFFERS, PAUL IJMERT
Executed: 2014-08-14
SARR, ABDOU
Executed: 2014-08-06
Assignee
MAPPER LITHOGRAPHY IP B.V.
COMPUTERLAAN 15, DELFT, 2628 XK, NETHERLANDS
Covered Property
(1)
Device for Spot Size Measurement at Wafer Level Using a Knife Edge and a Method for Manufacturing Such a Device
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.