IP Library › Assignment 034631/0296
Patent Assignment
Reel/Frame 034631/0296

Assignment of Assignor's Interest

Recorded: 2015-01-05 Pages: 2
Assignors
SHIRAHATA, KAORI
Executed: 2014-10-09
SOHDA, YASUNARI
Executed: 2014-10-09
SAKAKIBARA, MAKOTO
Executed: 2014-10-09
BIZEN, DAISUKE
Executed: 2014-10-09
KAWANO, HAJIME
Executed: 2014-10-09
KAZUMI, HIDEYUKI
Executed: 2014-10-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Critical Dimension Measurement Equipment and Method for Measuring Pattern Critical Dimension
Patent: 9,520,266 →
Application: 14/455,878 →
Publication: US 2015/0041648
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →