IP Library Assignment 034647/0268
Patent Assignment
Reel/Frame 034647/0268

Assignment of Assignor's Interest

Recorded: 2015-01-06 Pages: 3
Assignors
YAMAGUCH, SATORU
Executed: 2014-11-14
SAKAI, KEI
Executed: 2014-11-14
INOUE, OSAMU
Executed: 2014-11-14
HIRAO, KAZUYUKI
Executed: 2014-11-14
KOMURA, OSAMU
Executed: 2014-11-14
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Overlay Error Measuring Device and Computer Program for Causing Computer to Measure Pattern
Application: 14/413,198 →
Publication: US 2015/0285627
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →