Patent Assignment
Reel/Frame 034714/0323
Assignment of Assignor's Interest
Recorded: 2014-12-18
Pages: 4
Assignors
SEKI, HIROKAZU
Executed: 2014-11-17
SHINODA, MASAMICHI
Executed: 2014-11-17
TODOROKI, TOSHIYUKI
Executed: 2014-11-17
NAKANO, YOSHIHIRO
Executed: 2014-11-17
TORIZAWA, MAKOTO
Executed: 2014-11-17
Assignee
LASERTEC CORPORATION
2-10-1 SHIN-YOKOHAMA KOHOKU-KU, YOKOHAMA, 222-8552, JAPAN
Covered Property
(1)
Defect Classifying Method and Optical Inspection Apparatus for Silicon Carbide Substrate