Patent Assignment
Reel/Frame 034773/0210
Assignment of Assignor's Interest
Recorded: 2015-01-21
Pages: 9
Assignor
GEMIO TECHNOLOGIES, INC.
Executed: 2012-12-04
Assignee
HIEKE, ANDREAS, DR.
205 DE ANZA BLVD, SUITE 80, SAN MATEO, CALIFORNIA, 94402-3989
Covered Properties
(21)
Methods and Apparatus for Ion Sources, Ion Control and Ion Measurement for Macromolecules
Laser Desorption Ionization Ion Source with Charge Injection
Ion Source with Controlled Superpositon of Electrostatic and Gas Flow Fields
Methods and Apparatus for Ion Sources, Ion Control and Ion Measurement for Macromolecules
Ion source with controlled superposition of electrostatic and gas flow fields
Application:
60/547,259 →
Methods and apparatus for controlling ion current in an ion transmission device
Application:
11/063,801 →
Publication:
US 2005/0194543
Laser desorption ionization ion source with charge injection
Application:
60/798,377 →
Laser Desorption Ionization Ion Source with Charge Injection
Application:
13/118,541 →
Publication:
US 2012/0241642
Computer controlled active feedback system for LDI/ES ion source with electro-pneumatic superposition
Application:
60/843,205 →
Computer Controlled Active Feedback System for Ldi/Es Ion Source with Electro-Pneumatic Superposition
Application:
11/852,087 →
Publication:
US 2008/0078944
Methods and apparatus for controlling ion current in an ion transmission device
Application:
60/547,302 →
Methods and apparatus for controlling ion current in an ion transmission device
Application:
60/619,113 →
Laser desorption ionization ion source with self-adjusting holder and insertion system for one and two-dimensional sample chips
Application:
60/802,941 →
Methods and Apparatus for Ion Sources, Ion Control and Ion Measurement for Macromolecules
Application:
13/926,730 →
Publication:
US 2015/0115169
Methods and Apparatus for Ion Sources, Ion Control and Ion Measurement for Macromolecules
Laser Desorption Ionization Ion Source with Charge Injection
Ion Source with Controlled Superpositon of Electrostatic and Gas Flow Fields
Methods and Apparatus for Ion Sources, Ion Control and Ion Measurement for Macromolecules
Ion Source with Controlled Superposition of Electrostatic and Gas Flow Fields
PCT:
PCT/US2005/005662 ↗
Laser Desorption Ionization Ion Source with Charge Injection
PCT:
PCT/US2007/011055 ↗
Methods and Apparatus for Controlling Ion Current in an Ion Transmission Device
PCT:
PCT/US2005/005523 ↗
Related Assignments
(8)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 26, 2004
From: HIEKE, ANDREAS
To: CIPHERGEN BIOSYSTEMS, INC.
Reel/Frame 015258/0359 →
Assignment of Assignor's Interest
Apr 26, 2004
From: HIEKE, ANDREAS
To: CIPHERGEN BIOSYSTEMS, INC.
Reel/Frame 015258/0353 →
Assignment of Assignor's Interest
Mar 8, 2005
From: HIEKE, ANDREAS
To: CIPHERGEN BIOSYSTEMS, INC.
Reel/Frame 015859/0068 →
Assignment of Assignor's Interest
May 19, 2005
From: HIEKE, ANDREAS
To: CIPHERGEN BIOSYSTEMS, INC.
Reel/Frame 016253/0868 →
Assignment of Assignor's Interest
May 19, 2005
From: HIEKE, ANDREAS
To: CIPHERGEN BIOSYSTEMS, INC.
Reel/Frame 016259/0694 →
Assignment of Assignor's Interest
Jul 6, 2006
From: CIPHERGEN BIOSYSTEMS, INC.
To: GEMIO TECHNOLOGIES, INC.
Reel/Frame 017899/0635 →
Assignment of Assignor's Interest
Jul 6, 2006
From: CIPHERGEN BIOSYSTEMS, INC.
To: GEMIO TECHNOLOGIES, INC.
Reel/Frame 017899/0630 →
Assignment of Assignor's Interest
Dec 4, 2006
From: HIEKE, ANDREAS
To: GEMIO TECHNOLOGIES, INC.
Reel/Frame 018585/0905 →