IP Library Assignment 034977/0931
Patent Assignment
Reel/Frame 034977/0931

Assignment of Assignor's Interest

Recorded: 2015-02-18 Pages: 2
Assignors
OMINAMI, YUSUKE
Executed: 2015-01-15
SUZUKI, HIROYUKI
Executed: 2015-01-15
KAWANISHI, SHINSUKE
Executed: 2015-01-15
AJIMA, MASAHIKO
Executed: 2015-01-15
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device and Sample Observation Method
Patent: 9,240,305 →
Application: 14/422,186 →
Publication: US 2015/0235803
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →