IP Library › Assignment 034999/0799
Patent Assignment
Reel/Frame 034999/0799

Assignment of Assignor's Interest

Recorded: 2015-02-20 Pages: 2
Assignors
HIRAI, TAKEHIRO
Executed: 2015-01-28
SAKAMOTO, MASASHI
Executed: 2015-01-28
NAKAYAMA, HIDEKI
Executed: 2015-01-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Observation System and Defect Observation Method
Patent: 9,842,723 →
Application: 14/423,091 →
Publication: US 2015/0214000
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →