IP Library › Assignment 035003/0694
Patent Assignment
Reel/Frame 035003/0694

Assignment of Assignor's Interest

Recorded: 2015-02-23 Pages: 2
Assignors
ISAWA, MIKI
Executed: 2015-01-17
SAKAI, KEI
Executed: 2015-01-14
HASEGAWA, NORIO
Executed: 2015-01-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measurement Device, Evaluation Method of Polymer Compounds Used in Self-Assembly Lithography, and Computer Program
Patent: 9,589,343 →
Application: 14/422,603 →
Publication: US 2015/0243008
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →