IP Library Assignment 035086/0102
Patent Assignment
Reel/Frame 035086/0102

Assignment of Assignor's Interest

Recorded: 2015-03-04 Pages: 2
Assignors
URANO, YUTA
Executed: 2015-02-02
HONDA, TOSHIFUMI
Executed: 2015-02-05
SHIBATA, YUKIHIRO
Executed: 2015-02-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
22-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Device
Patent: 9,310,318 →
Application: 14/638,305 →
Publication: US 2015/0276623
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the Receiving Party's Street Address Previously Recorded on Reel 035086 Frame 0102. Assignor(S) Hereby Confirms the Street Address of the Receivnig Party Is 24-14, Nishishimbashi 1-Chome. Aug 14, 2015
From: URANO, YUTA; HONDA, TOSHIFUMI; SHIBATA, YUKIHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 036353/0144 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →