IP Library Assignment 035106/0752
Patent Assignment
Reel/Frame 035106/0752

Assignment of Assignor's Interest

Recorded: 2015-03-06 Pages: 3
Assignors
REED, DAVID A.
Executed: 2015-02-13
SCHUELER, BRUNO W.
Executed: 2015-02-13
NEWCOME, BRUCE H.
Executed: 2015-02-13
SMEDT, RODNEY
Executed: 2015-02-27
Assignee
REVERA, INCORPORATED
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Property (1)
System and Method for Characterization and Process Control of Structures on Semiconductor Wafers during Manufacturing using Secondary Ion Mass Spectrometry
Application: 62/114,521 →
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Feb 26, 2018
From: REVERA INCORPORATED
To: NOVA MEASURING INTRUMENTS INC.
Reel/Frame 045043/0106 →