Patent Assignment
Reel/Frame 035270/0753
Assignment of Assignor's Interest
Recorded: 2015-03-27
Pages: 3
Assignors
TAKAHASHI, MASATAKE
Executed: 2015-01-05
TOMIYAMA, MIZUHO
Executed: 2015-01-05
SASAKI, YASUHIRO
Executed: 2015-01-05
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, 108-8001, JAPAN
Covered Property
(1)
Defect Analysis Device, Defect Analysis Method, and Program