IP Library Assignment 035314/0068
Patent Assignment
Reel/Frame 035314/0068

Assignment of Assignor's Interest

Recorded: 2015-04-01 Pages: 6
Assignors
PARK, SEA EUN
Executed: 2014-10-30
YUN, SUNG HEE
Executed: 2014-10-30
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO,, SUWON-SI, 443-742, KOREA, REPUBLIC OF
Covered Property (1)
Method of Testing Semiconductor Memory Device, Test Device, and Computer Readable Recording Medium for Recording Test Program for Semiconductor Memory Device
Patent: 9,666,304 →
Application: 14/676,395 →
Publication: US 2015/0287476