IP Library › Assignment 035339/0411
Patent Assignment
Reel/Frame 035339/0411

Assignment of Assignor's Interest

Recorded: 2015-04-06 Pages: 3
Assignors
MINAKAWA, TSUYOSHI
Executed: 2015-03-16
HIROI, TAKASHI
Executed: 2015-03-23
YOSHIDA, TAKEYUKI
Executed: 2015-03-16
NINOMIYA, TAKU
Executed: 2015-03-19
YAMAMOTO, TAKUMA
Executed: 2015-03-16
SHINDO, HIROYUKI
Executed: 2015-03-16
FUKUNAGA, FUMIHIKO
Executed: 2015-03-16
TOYODA, YASUTAKA
Executed: 2015-03-16
SHINODA, SHINICHI
Executed: 2015-03-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Inspecting and Measuring Device and Program
Patent: 9,858,659 →
Application: 14/433,698 →
Publication: US 2015/0228063
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →