IP Library › Assignment 035392/0730
Patent Assignment
Reel/Frame 035392/0730

Assignment of Assignor's Interest

Recorded: 2015-04-13 Pages: 2
Assignors
YAMAMOTO, TAKUMA
Executed: 2015-03-17
FUNAKOSHI, TOMOHIRO
Executed: 2015-03-17
TANIMOTO, KENJI
Executed: 2015-03-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device and Overlay Misalignment Measurement Method
Patent: 9,224,575 →
Application: 14/435,203 →
Publication: US 2015/0287569
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →