Patent Assignment
Reel/Frame 035477/0916
Assignment of Assignor's Interest
Recorded: 2015-04-23
Pages: 5
Assignors
LUOH, TUUNG
Executed: 2015-03-13
HUANG, I-JEN
Executed: 2015-03-13
YANG, LING-WUU
Executed: 2015-03-17
YANG, TA-HONE
Executed: 2015-03-16
CHEN, KUANG-CHAO
Executed: 2015-03-16
Assignee
MACRONIX INTERNATIONAL CO., LTD.
NO. 16, LI-HSIN RD., SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Property
(1)
Method and System for Detecting Defects of Wafer by Wafer Sort