IP Library Assignment 035654/0282
Patent Assignment
Reel/Frame 035654/0282

Assignment of Assignor's Interest

Recorded: 2015-05-17 Pages: 2
Assignors
OMINAMI, YUSUKE
Executed: 2015-04-02
KONOMI, MAMI
Executed: 2015-04-03
KAWANISHI, SHINSUKE
Executed: 2015-04-02
SUZUKI, HIROYUKI
Executed: 2015-04-02
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Charged Particle Beam Device, Sample Stage Unit, and Sample Observation Method
Patent: 9,472,375 →
Application: 14/443,293 →
Publication: US 2015/0311033
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →