IP Library Assignment 035700/0271
Patent Assignment
Reel/Frame 035700/0271

Assignment of Assignor's Interest

Recorded: 2015-05-22 Pages: 2
Assignors
OMINAMI, YUSUKE
Executed: 2015-04-09
OHSHIMA, TAKASHI
Executed: 2015-04-13
ITO, SUKEHIRO
Executed: 2015-04-13
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 1058717, JAPAN
Covered Property (1)
Sample Base, Charged Particle Beam Device and Sample Observation Method
Patent: 9,508,527 →
Application: 14/646,159 →
Publication: US 2015/0318143
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →