Patent Assignment
Reel/Frame 035751/0200
Assignment of Assignor's Interest
Recorded: 2015-06-01
Pages: 4
Assignors
HARA, MAKOTO
Executed: 2014-12-08
MATSUMOTO, SHUUJI
Executed: 2014-12-08
OOTUKA, HIROSI
Executed: 2014-12-08
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Semiconductor Device and Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.