IP Library › Assignment 035810/0839
Patent Assignment
Reel/Frame 035810/0839

Assignment of Assignor's Interest

Recorded: 2015-06-09 Pages: 2
Assignors
HIRAI, TAKEHIRO
Executed: 2015-04-24
NAKAGAKI, RYO
Executed: 2015-04-24
HARADA, MINORU
Executed: 2015-04-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Observation Method and Defect Observation Device
Patent: 9,569,836 →
Application: 14/650,515 →
Publication: US 2015/0302568
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →