IP Library › Assignment 035850/0014
Patent Assignment
Reel/Frame 035850/0014

Assignment of Assignor's Interest

Recorded: 2015-06-17 Pages: 3
Assignors
ATRASH, FOUAD
Executed: 2015-06-11
TOKAR, ALEX
Executed: 2015-06-11
Assignee
JORDAN VALLEY SEMICONDUCTORS LTD.
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Property (1)
Method for Accurately Determining the Thickness and/or Elemental Composition of Small Features on Thin-Substrates Using Micro-Xrf
Patent: 9,632,043 →
Application: 14/708,323 →
Publication: US 2015/0330921
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 11, 2015
From: MAZOR, ISAAC; OSTROVSKY, OLGA
To: JORDAN VALLEY SEMICONDUCTORS LTD.
Reel/Frame 035603/0431 →
Change of Name Feb 15, 2016
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER JV ISRAEL LTD.
Reel/Frame 037820/0200 →
Change of Name May 20, 2021
From: BRUKER SCIENTIFIC LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056297/0059 →
Change of Name May 20, 2021
From: BRUKER JV ISRAEL LTD.
To: BRUKER SCIENTIFIC LTD.
Reel/Frame 056297/0129 →