Patent Assignment
Reel/Frame 035908/0369
Assignment of Assignor's Interest
Recorded: 2015-06-25
Pages: 2
Assignors
OBARA, KENJI
Executed: 2015-05-13
UMEHARA, SATOSHI
Executed: 2015-05-13
SUZUKI, NAOMASA
Executed: 2015-05-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Charged Particle Beam Device and Method for Analyzing Defect Therein
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.