IP Library Assignment 035929/0370
Patent Assignment
Reel/Frame 035929/0370

Assignment of Assignor's Interest

Recorded: 2015-06-29 Pages: 2
Assignors
HARADA, MINORU
Executed: 2015-05-11
TAKAGI, YUJI
Executed: 2015-05-11
NAKAGAKI, RYO
Executed: 2015-05-13
HIRAI, TAKEHIRO
Executed: 2015-05-19
KITSUKI, HIROHIKO
Executed: 2015-05-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Observation Method and Defect Observation Device
Patent: 9,811,897 →
Application: 14/652,198 →
Publication: US 2015/0332445
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →