IP Library › Assignment 036001/0463
Patent Assignment
Reel/Frame 036001/0463

Assignment of Assignor's Interest

Recorded: 2015-07-06 Pages: 2
Assignors
URANO, TAKAHIRO
Executed: 2015-06-24
HONDA, TOSHIFUMI
Executed: 2015-06-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Device
Patent: 9,865,046 →
Application: 14/758,063 →
Publication: US 2015/0356727
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →