Patent Assignment
Reel/Frame 036057/0017
Assignment of Assignor's Interest
Recorded: 2015-07-10
Pages: 2
Assignors
KANNO, SEIICHIRO
Executed: 2015-06-09
EBIZUKA, YASUSHI
Executed: 2015-06-09
MIYA, GO
Executed: 2015-06-09
MIWA, TAKAFUMI
Executed: 2015-06-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Charged Particle Beam Apparatus for Measuring Surface Potential of a Sample
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.